Model-Based Segmentation-Supported Camera Tracking in Fab’s Indoor Environments
Currently, it is a norm to design a semiconductor fab using building information models (BIMs), which refer to a digital representation of a building’s physical and functional characteristics. The comprehensive data provided by BIMs include 3D geometric models. This paper presents a 3D mo...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10596301/ |
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