Analysis of Microstructural Changes, Morphology and Optical Properties of the Surface of Copper Oxide Thin Layers due to Annealing for Use in Optoelectronic Devices
In this study, the effect of thermal annealing on copper oxide thin films was investigated. The surface properties of copper thin films were examined with the goal of employing them as active layers in optoelectronic devices such as solar cells and optical detectors. Thin layers of copper oxide were...
Saved in:
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | fas |
| Published: |
Isfahan University of Technology
2024-08-01
|
| Series: | Journal of Advanced Materials in Engineering |
| Subjects: | |
| Online Access: | https://jame.iut.ac.ir/article_3518_4cae90c664abc5cbb7a174898ca68f5d.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|