APA (7th ed.) Citation

Karsenty, A., & Chelly, A. Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate-Recessed Channel Process. Wiley.

Chicago Style (17th ed.) Citation

Karsenty, Avi, and Avraham Chelly. Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate-Recessed Channel Process. Wiley.

MLA (9th ed.) Citation

Karsenty, Avi, and Avraham Chelly. Anomalous DIBL Effect in Fully Depleted SOI MOSFETs Using Nanoscale Gate-Recessed Channel Process. Wiley.

Warning: These citations may not always be 100% accurate.