A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components
A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measuremen...
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| Format: | Article |
| Language: | English |
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Wiley
2017-01-01
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| Series: | International Journal of Antennas and Propagation |
| Online Access: | http://dx.doi.org/10.1155/2017/7852135 |
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| _version_ | 1850223606368305152 |
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| author | Xin Cao Zongxi Tang |
| author_facet | Xin Cao Zongxi Tang |
| author_sort | Xin Cao |
| collection | DOAJ |
| description | A wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measurement standards and fixture are designed based on these two calibration methods. For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured. The parasitic effects of the SMD capacitors are analyzed. The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components. |
| format | Article |
| id | doaj-art-494e26fbed65477ea25cee9aa5078cf4 |
| institution | OA Journals |
| issn | 1687-5869 1687-5877 |
| language | English |
| publishDate | 2017-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | International Journal of Antennas and Propagation |
| spelling | doaj-art-494e26fbed65477ea25cee9aa5078cf42025-08-20T02:05:52ZengWileyInternational Journal of Antennas and Propagation1687-58691687-58772017-01-01201710.1155/2017/78521357852135A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD ComponentsXin Cao0Zongxi Tang1School of Electronic Engineering, University of Electronic Science and Technology of China, No. 2006, Xiyuan Road, West Hi-Tech Zone, Chengdu 611731, ChinaSchool of Electronic Engineering, University of Electronic Science and Technology of China, No. 2006, Xiyuan Road, West Hi-Tech Zone, Chengdu 611731, ChinaA wide-band test fixture is designed for the measurement of parasitic effects of RF passive SMD (surface mounted devices) components. Two calibration methods, TRM (Thru-Reflect-Match) from 45 MHz to 2 GHz and TRL (Thru-Reflect-Line) from 2 GHz to 12 GHz, are used for error correction. The measurement standards and fixture are designed based on these two calibration methods. For experimental verification, the multilayered ceramic SMD capacitors of Johanson Technology are measured. The parasitic effects of the SMD capacitors are analyzed. The designed fixture is feasible and applicable for quick and accurate measurement of RF passive SMD components.http://dx.doi.org/10.1155/2017/7852135 |
| spellingShingle | Xin Cao Zongxi Tang A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components International Journal of Antennas and Propagation |
| title | A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components |
| title_full | A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components |
| title_fullStr | A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components |
| title_full_unstemmed | A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components |
| title_short | A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components |
| title_sort | wide band test fixture for analyzing parasitic effects of rf passive smd components |
| url | http://dx.doi.org/10.1155/2017/7852135 |
| work_keys_str_mv | AT xincao awidebandtestfixtureforanalyzingparasiticeffectsofrfpassivesmdcomponents AT zongxitang awidebandtestfixtureforanalyzingparasiticeffectsofrfpassivesmdcomponents AT xincao widebandtestfixtureforanalyzingparasiticeffectsofrfpassivesmdcomponents AT zongxitang widebandtestfixtureforanalyzingparasiticeffectsofrfpassivesmdcomponents |