Cao, X., & Tang, Z. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. Wiley.
Chicago Style (17th ed.) CitationCao, Xin, and Zongxi Tang. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. Wiley.
MLA (9th ed.) CitationCao, Xin, and Zongxi Tang. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components. Wiley.
Warning: These citations may not always be 100% accurate.