Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations

Ion Migration and Space‐Charge Zones in Metal Halide Perovskites Through Short‐Circuit Transient Current and Numerical Simulations

Abstract The inherent ion migration in metal halide perovskite materials is known to induce deleterious and highly unstable dark currents in X‐ and γ‐ray detectors based on those compounds upon bias application. Dark current slow drift with time is identified as one of the major drawbacks for these...

Full description

Saved in:
Bibliographic Details
Main Authors: Agustin O. Alvarez, Marisé García‐Batlle, Ferdinand Lédée, Eric Gros‐Daillon, Javier Mayén Guillén, Jean‐Marie Verilhac, Thibault Lemercier, Julien Zaccaro, Lluis F. Marsal, Osbel Almora, Germà Garcia‐Belmonte
Format: Article
Language:English
Published: Wiley-VCH 2024-11-01
Series:Advanced Electronic Materials
Subjects:
charge carrier mobility
drift‐diffusion simulations
ionic conductivity
metal halide perovskites
x‐ray detectors
Online Access:https://doi.org/10.1002/aelm.202400241
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items

Similar Items