Development of High voltage 4H-SiC Junction Barrier Schottky Diode with 3 300 V Blocking Voltage
In order to meet the demands of high-voltage SiC diodes in railway traction, different gate parameters were applied to the active area of 4H-SiC device and their effects on device performance were comparatively analyzed through TCAD simulation. The junction termination extension (JTE) structures us...
Saved in:
| Main Authors: | PENG Zhaoyang, BAI Yun, SHEN Huajun, WU Yudong, GAO Yunbin, LIU Xinyu |
|---|---|
| Format: | Article |
| Language: | zho |
| Published: |
Editorial Office of Control and Information Technology
2016-01-01
|
| Series: | Kongzhi Yu Xinxi Jishu |
| Subjects: | |
| Online Access: | http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2095-3631.2016.05.200 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Research on the Temperature Characteristics of 1 200 V 4H-SiC Junction Barrier Schottky Diode
by: YUAN Hao, et al.
Published: (2016-01-01) -
Simulation Based Analysis of Temperature Effect on Breakdown Voltage of Ion Implanted Co/n-Si Schottky Diode
by: Vibhor Kumar, et al.
Published: (2012-12-01) -
Current‐voltage model of a graphene nanoribbon p‐n junction and Schottky junction diode
by: Samira Shamsir, et al.
Published: (2022-03-01) -
Novel 4H-SiC Double-Trench MOSFETs with Integrated Schottky Barrier and MOS-Channel Diodes for Enhanced Breakdown Voltage and Switching Characteristics
by: Peiran Wang, et al.
Published: (2025-06-01) -
Application Research of 1 700 V/1 600 A SiC Hybrid IGBT
by: YANG Tao, et al.
Published: (2018-01-01)