Expediting Manufacturing Launch Using Integrated Data With AI/ML Analytic Solutions
Manufacturing yield, test time and quality are important metrics in new product introduction (NPI) to manufacturing safe launch. A powerful yield management system is crucial to achieve the goal metrics. In this paper, recommended yield management system selection criteria, data integration and mach...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Journal of the Electron Devices Society |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10816252/ |
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