The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
Saved in:
Main Author: | |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
1984-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.11.197 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
_version_ | 1832566671537078272 |
---|---|
author | P. Trägner |
author_facet | P. Trägner |
author_sort | P. Trägner |
collection | DOAJ |
format | Article |
id | doaj-art-44f0f04a97a84b76bcd079941ba8acd1 |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1984-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-44f0f04a97a84b76bcd079941ba8acd12025-02-03T01:03:23ZengWileyActive and Passive Electronic Components0882-75161563-50311984-01-0111319720110.1155/APEC.11.197The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic ComponentsP. Trägnerhttp://dx.doi.org/10.1155/APEC.11.197 |
spellingShingle | P. Trägner The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components Active and Passive Electronic Components |
title | The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components |
title_full | The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components |
title_fullStr | The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components |
title_full_unstemmed | The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components |
title_short | The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components |
title_sort | use of the non contacting temperature measuring techniques in the early detection of hidden faults in electronic components |
url | http://dx.doi.org/10.1155/APEC.11.197 |
work_keys_str_mv | AT ptramp228gner theuseofthenoncontactingtemperaturemeasuringtechniquesintheearlydetectionofhiddenfaultsinelectroniccomponents AT ptramp228gner useofthenoncontactingtemperaturemeasuringtechniquesintheearlydetectionofhiddenfaultsinelectroniccomponents |