The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components

Saved in:
Bibliographic Details
Main Author: P. Trägner
Format: Article
Language:English
Published: Wiley 1984-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.11.197
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1832566671537078272
author P. Trägner
author_facet P. Trägner
author_sort P. Trägner
collection DOAJ
format Article
id doaj-art-44f0f04a97a84b76bcd079941ba8acd1
institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1984-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-44f0f04a97a84b76bcd079941ba8acd12025-02-03T01:03:23ZengWileyActive and Passive Electronic Components0882-75161563-50311984-01-0111319720110.1155/APEC.11.197The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic ComponentsP. Trägnerhttp://dx.doi.org/10.1155/APEC.11.197
spellingShingle P. Trägner
The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
Active and Passive Electronic Components
title The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
title_full The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
title_fullStr The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
title_full_unstemmed The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
title_short The Use of the Non-Contacting Temperature Measuring Techniques in the Early Detection of Hidden Faults in Electronic Components
title_sort use of the non contacting temperature measuring techniques in the early detection of hidden faults in electronic components
url http://dx.doi.org/10.1155/APEC.11.197
work_keys_str_mv AT ptramp228gner theuseofthenoncontactingtemperaturemeasuringtechniquesintheearlydetectionofhiddenfaultsinelectroniccomponents
AT ptramp228gner useofthenoncontactingtemperaturemeasuringtechniquesintheearlydetectionofhiddenfaultsinelectroniccomponents