Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance

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Bibliographic Details
Main Authors: C. Balasubramanian, M. Radhakrishnan, K. Narayandas
Format: Article
Language:English
Published: Wiley 1982-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/APEC.9.171
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author C. Balasubramanian
M. Radhakrishnan
K. Narayandas
author_facet C. Balasubramanian
M. Radhakrishnan
K. Narayandas
author_sort C. Balasubramanian
collection DOAJ
format Article
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institution Kabale University
issn 0882-7516
1563-5031
language English
publishDate 1982-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-41176c8cdc2a444baa78f26f4977e7692025-02-03T01:23:28ZengWileyActive and Passive Electronic Components0882-75161563-50311982-01-019317117810.1155/APEC.9.171Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical ResistanceC. BalasubramanianM. RadhakrishnanK. Narayandashttp://dx.doi.org/10.1155/APEC.9.171
spellingShingle C. Balasubramanian
M. Radhakrishnan
K. Narayandas
Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
Active and Passive Electronic Components
title Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
title_full Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
title_fullStr Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
title_full_unstemmed Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
title_short Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
title_sort defect density and electrical properties of vacuum evaporated copper films from annealing studies of electrical resistance
url http://dx.doi.org/10.1155/APEC.9.171
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AT mradhakrishnan defectdensityandelectricalpropertiesofvacuumevaporatedcopperfilmsfromannealingstudiesofelectricalresistance
AT knarayandas defectdensityandelectricalpropertiesofvacuumevaporatedcopperfilmsfromannealingstudiesofelectricalresistance