Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance
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Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Wiley
1982-01-01
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Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.9.171 |
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author | C. Balasubramanian M. Radhakrishnan K. Narayandas |
author_facet | C. Balasubramanian M. Radhakrishnan K. Narayandas |
author_sort | C. Balasubramanian |
collection | DOAJ |
format | Article |
id | doaj-art-41176c8cdc2a444baa78f26f4977e769 |
institution | Kabale University |
issn | 0882-7516 1563-5031 |
language | English |
publishDate | 1982-01-01 |
publisher | Wiley |
record_format | Article |
series | Active and Passive Electronic Components |
spelling | doaj-art-41176c8cdc2a444baa78f26f4977e7692025-02-03T01:23:28ZengWileyActive and Passive Electronic Components0882-75161563-50311982-01-019317117810.1155/APEC.9.171Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical ResistanceC. BalasubramanianM. RadhakrishnanK. Narayandashttp://dx.doi.org/10.1155/APEC.9.171 |
spellingShingle | C. Balasubramanian M. Radhakrishnan K. Narayandas Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance Active and Passive Electronic Components |
title | Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance |
title_full | Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance |
title_fullStr | Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance |
title_full_unstemmed | Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance |
title_short | Defect Density and Electrical Properties of Vacuum Evaporated Copper Films From Annealing Studies of Electrical Resistance |
title_sort | defect density and electrical properties of vacuum evaporated copper films from annealing studies of electrical resistance |
url | http://dx.doi.org/10.1155/APEC.9.171 |
work_keys_str_mv | AT cbalasubramanian defectdensityandelectricalpropertiesofvacuumevaporatedcopperfilmsfromannealingstudiesofelectricalresistance AT mradhakrishnan defectdensityandelectricalpropertiesofvacuumevaporatedcopperfilmsfromannealingstudiesofelectricalresistance AT knarayandas defectdensityandelectricalpropertiesofvacuumevaporatedcopperfilmsfromannealingstudiesofelectricalresistance |