Fast automatic multiscale electron tomography for sensitive materials under environmental conditions
Abstract The demand for characterisation of beam-sensitive samples at the nanoscale in environmental conditions is increasing for applications in materials science and biology. Here we communicate a protocol with custom software, enabling precise control over the electron microscope, and a custom sa...
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| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-08-01
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| Series: | Communications Engineering |
| Online Access: | https://doi.org/10.1038/s44172-025-00482-7 |
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