Magnetron-Sputtered and Rapid-Thermally Annealed NiO:Cu Thin Films on 3D Porous Substrates for Supercapacitor Electrodes

The performance of NiO-based supercapacitor electrodes for energy storage systems was enhanced by doping Cu into NiO thin films (200 nm) using radio-frequency magnetron co-sputtering on 3D porous Ni foam substrates, followed by rapid thermal annealing. The Hall effect measurements demonstrated enhan...

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Bibliographic Details
Main Authors: Seongha Oh, Young-Kil Jun, Nam-Hoon Kim
Format: Article
Language:English
Published: MDPI AG 2025-05-01
Series:Energies
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Online Access:https://www.mdpi.com/1996-1073/18/11/2704
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Summary:The performance of NiO-based supercapacitor electrodes for energy storage systems was enhanced by doping Cu into NiO thin films (200 nm) using radio-frequency magnetron co-sputtering on 3D porous Ni foam substrates, followed by rapid thermal annealing. The Hall effect measurements demonstrated enhanced electrical conductivity, with resistivity values of 1.244 × 10<sup>−4</sup> Ω·cm. The 3D porous NiO:Cu electrodes significantly increased the specific capacitance and achieved a value of 1809.2 Fg<sup>−1</sup>, with the NiO:Cu (10 at% Cu) thin films at a scan rate of 5 mVs<sup>−1</sup>, which is a 2.67-fold increase compared with the undoped NiO films on a glass substrate. The 3D porous NiO:Cu electrodes significantly improved the electrochemical properties of the NiO-based electrode, which resulted in a higher specific capacitance for enhancing the energy storage performance during grid stabilization.
ISSN:1996-1073