Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials
Abstract Polarized optical contrast spectroscopy is a simple and non-destructive approach to characterize the crystalline anisotropy and orientation of two-dimensional materials. Here, we develop a 3D-printed motorized polarization module, which is compatible with typical microscope platforms and en...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-05-01
|
| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-96894-8 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850206205382754304 |
|---|---|
| author | Ernst Knöckl Alexandre Bernard Alexander Holleitner Christoph Kastl |
| author_facet | Ernst Knöckl Alexandre Bernard Alexander Holleitner Christoph Kastl |
| author_sort | Ernst Knöckl |
| collection | DOAJ |
| description | Abstract Polarized optical contrast spectroscopy is a simple and non-destructive approach to characterize the crystalline anisotropy and orientation of two-dimensional materials. Here, we develop a 3D-printed motorized polarization module, which is compatible with typical microscope platforms and enables to perform broadband polarization-resolved reflectance spectroscopy. As proof of principle, we investigate the in-plane birefringence of exfoliated $$\hbox {MoO}_3$$ thin films and few-layer $$\hbox {WTe}_2$$ crystals. We compare the measured spectra to a model based on a transfer matrix formalism. Compared to other polarization sensitive approaches, such as Raman or second harmonic generation spectroscopy, optical contrast measurements require orders of magnitude less excitation power densities, which is particularly advantageous to avoid degradation of delicate van der Waals layers. |
| format | Article |
| id | doaj-art-4089418532ef495e96e741ac7e1f3154 |
| institution | OA Journals |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-05-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj-art-4089418532ef495e96e741ac7e1f31542025-08-20T02:10:54ZengNature PortfolioScientific Reports2045-23222025-05-011511710.1038/s41598-025-96894-8Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materialsErnst Knöckl0Alexandre Bernard1Alexander Holleitner2Christoph Kastl3Walter Schottky Institute and Physics Department, Technical University of MunichWalter Schottky Institute and Physics Department, Technical University of MunichWalter Schottky Institute and Physics Department, Technical University of MunichWalter Schottky Institute and Physics Department, Technical University of MunichAbstract Polarized optical contrast spectroscopy is a simple and non-destructive approach to characterize the crystalline anisotropy and orientation of two-dimensional materials. Here, we develop a 3D-printed motorized polarization module, which is compatible with typical microscope platforms and enables to perform broadband polarization-resolved reflectance spectroscopy. As proof of principle, we investigate the in-plane birefringence of exfoliated $$\hbox {MoO}_3$$ thin films and few-layer $$\hbox {WTe}_2$$ crystals. We compare the measured spectra to a model based on a transfer matrix formalism. Compared to other polarization sensitive approaches, such as Raman or second harmonic generation spectroscopy, optical contrast measurements require orders of magnitude less excitation power densities, which is particularly advantageous to avoid degradation of delicate van der Waals layers.https://doi.org/10.1038/s41598-025-96894-8Microscopyvan der Waals materialsBirefringenceOptical anisotropy |
| spellingShingle | Ernst Knöckl Alexandre Bernard Alexander Holleitner Christoph Kastl Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials Scientific Reports Microscopy van der Waals materials Birefringence Optical anisotropy |
| title | Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials |
| title_full | Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials |
| title_fullStr | Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials |
| title_full_unstemmed | Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials |
| title_short | Polarized optical contrast spectroscopy of in plane anisotropic van der Waals materials |
| title_sort | polarized optical contrast spectroscopy of in plane anisotropic van der waals materials |
| topic | Microscopy van der Waals materials Birefringence Optical anisotropy |
| url | https://doi.org/10.1038/s41598-025-96894-8 |
| work_keys_str_mv | AT ernstknockl polarizedopticalcontrastspectroscopyofinplaneanisotropicvanderwaalsmaterials AT alexandrebernard polarizedopticalcontrastspectroscopyofinplaneanisotropicvanderwaalsmaterials AT alexanderholleitner polarizedopticalcontrastspectroscopyofinplaneanisotropicvanderwaalsmaterials AT christophkastl polarizedopticalcontrastspectroscopyofinplaneanisotropicvanderwaalsmaterials |