Surface Characteristics and Performance Optimization of W-Doped Vanadium Dioxide Thin Films

Surface Characteristics and Performance Optimization of W-Doped Vanadium Dioxide Thin Films

This study explores the surface characteristics evaluation and performance optimization of tungsten (W)-doped vanadium dioxide (VO<sub>2</sub>) thin films. W-doped vanadium dioxide films were deposited on B270 glass substrates using an electron beam evaporation technique combined with th...

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Bibliographic Details
Main Authors:	Chuen-Lin Tien, Chun-Yu Chiang, Jia-Kai Tien, Ching-Chiun Wang, Shih-Chin Lin
Format:	Article
Language:	English
Published:	MDPI AG 2024-12-01
Series:	Surfaces
Subjects:	vanadium dioxide thin film Taguchi method surface roughness residual stress
Online Access:	https://www.mdpi.com/2571-9637/7/4/73
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