An In Situ Automated System for Real-Time Monitoring of Failures in Large-Scale Field Emitter Arrays
Nano-scale vacuum transistors (NVCTs) based on field emission have the potential to operate at high frequencies and withstand harsh environments, such as radiation, high temperatures, and high power. However, they have demonstrated instability and failures over time. To achieve high currents from NV...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-10-01
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| Series: | Instruments |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2410-390X/8/4/44 |
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