Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation

In this study, AlOx passivation layers on the rear sides of silicon PERC solar cells are formed by thermally oxidizing 3 nm-thick aluminum films deposited in advance by an e-gun evaporator. The oxidation process is conducted in a furnace full of oxygen at 400°C for a duration of 10 minutes, followed...

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Main Authors: Ching-Hui Hsu, Da-Yao Lao, Likarn Wang
Format: Article
Language:English
Published: Wiley 2023-01-01
Series:International Journal of Photoenergy
Online Access:http://dx.doi.org/10.1155/2023/3312619
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author Ching-Hui Hsu
Da-Yao Lao
Likarn Wang
author_facet Ching-Hui Hsu
Da-Yao Lao
Likarn Wang
author_sort Ching-Hui Hsu
collection DOAJ
description In this study, AlOx passivation layers on the rear sides of silicon PERC solar cells are formed by thermally oxidizing 3 nm-thick aluminum films deposited in advance by an e-gun evaporator. The oxidation process is conducted in a furnace full of oxygen at 400°C for a duration of 10 minutes, followed by annealing for a duration of 3 minutes at 700°C, and then the stacking of SiNx films on the back surfaces. After that, a second annealing process is done at 400°C for a duration of 10 minutes to repair the defects resulting from the bombardment of ions on the passivation layer. With the thermal oxidation method applied, we confirmed the existence of an AlOx passivation layer with a negative charge density of −3.21×1012 cm-2 for an annealed sample, in contrast to −6.17×1011 cm-2 for an unannealed sample.
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institution OA Journals
issn 1687-529X
language English
publishDate 2023-01-01
publisher Wiley
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series International Journal of Photoenergy
spelling doaj-art-3f15c02449084df8bf7c37e72b8e8e062025-08-20T02:16:33ZengWileyInternational Journal of Photoenergy1687-529X2023-01-01202310.1155/2023/3312619Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace OxidationChing-Hui Hsu0Da-Yao Lao1Likarn Wang2Institute of Photonics TechnologiesInstitute of Photonics TechnologiesInstitute of Photonics TechnologiesIn this study, AlOx passivation layers on the rear sides of silicon PERC solar cells are formed by thermally oxidizing 3 nm-thick aluminum films deposited in advance by an e-gun evaporator. The oxidation process is conducted in a furnace full of oxygen at 400°C for a duration of 10 minutes, followed by annealing for a duration of 3 minutes at 700°C, and then the stacking of SiNx films on the back surfaces. After that, a second annealing process is done at 400°C for a duration of 10 minutes to repair the defects resulting from the bombardment of ions on the passivation layer. With the thermal oxidation method applied, we confirmed the existence of an AlOx passivation layer with a negative charge density of −3.21×1012 cm-2 for an annealed sample, in contrast to −6.17×1011 cm-2 for an unannealed sample.http://dx.doi.org/10.1155/2023/3312619
spellingShingle Ching-Hui Hsu
Da-Yao Lao
Likarn Wang
Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
International Journal of Photoenergy
title Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
title_full Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
title_fullStr Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
title_full_unstemmed Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
title_short Monocrystalline Silicon PERC Solar Cell with Rear-Side AlOx Film Formed by Furnace Oxidation
title_sort monocrystalline silicon perc solar cell with rear side alox film formed by furnace oxidation
url http://dx.doi.org/10.1155/2023/3312619
work_keys_str_mv AT chinghuihsu monocrystallinesiliconpercsolarcellwithrearsidealoxfilmformedbyfurnaceoxidation
AT dayaolao monocrystallinesiliconpercsolarcellwithrearsidealoxfilmformedbyfurnaceoxidation
AT likarnwang monocrystallinesiliconpercsolarcellwithrearsidealoxfilmformedbyfurnaceoxidation