Chang, C., Sfarra, S., Hsu, N., & Yao, Y. Spatial Structure Analysis for Subsurface Defect Detection in Materials Using Active Infrared Thermography and Adaptive Fixed-Rank Kriging. MDPI AG.
Chicago Style (17th ed.) CitationChang, Chun-Han, Stefano Sfarra, Nan-Jung Hsu, and Yuan Yao. Spatial Structure Analysis for Subsurface Defect Detection in Materials Using Active Infrared Thermography and Adaptive Fixed-Rank Kriging. MDPI AG.
MLA (9th ed.) CitationChang, Chun-Han, et al. Spatial Structure Analysis for Subsurface Defect Detection in Materials Using Active Infrared Thermography and Adaptive Fixed-Rank Kriging. MDPI AG.
Warning: These citations may not always be 100% accurate.