Ultimate-scaled one-dimensional transistors: Surpassing the subthreshold swing limit
The continuous miniaturization of field-effect transistors (FETs) has propelled microprocessors to unprecedented levels of integration. However, further scaling encounters a critical trade-off between integration density and power efficiency. To transcend this limitation, a new class of steep-slope...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2024-09-01
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| Series: | Computational Materials Today |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2950463524000085 |
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