The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing
The microstructural evolution and relaxation strengthening of nano-grained Ni annealed at a temperature range of 493–553 K were studied by in situ X-ray diffraction technique, transmission electron microscopy, and microhardness evaluation. Upon low-temperature annealing, the rather limited variatio...
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KeAi Communications Co., Ltd.
2024-12-01
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| Series: | Nano Materials Science |
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| Online Access: | http://www.sciencedirect.com/science/article/pii/S2589965123000934 |
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| author | Ze Chai Bo Peng Xukai Ren Kaiyuan Hong Xiaoqi Chen |
| author_facet | Ze Chai Bo Peng Xukai Ren Kaiyuan Hong Xiaoqi Chen |
| author_sort | Ze Chai |
| collection | DOAJ |
| description | The microstructural evolution and relaxation strengthening of nano-grained Ni annealed at a temperature range of 493–553 K were studied by in situ X-ray diffraction technique, transmission electron microscopy, and microhardness evaluation. Upon low-temperature annealing, the rather limited variations of anisotropic grain size and root-mean-square strain, conforming to an exponential relaxation model, yield a consistent activation energy of approximately 0.5 eV, which corresponds to the localized, rapid diffusion of excess vacancies on nonequilibrium surfaces/interfaces and/or defective lattice configurations. Microstructure examinations confirm the grain boundary ordering and excess defect reduction. The relaxation-induced strength enhancement can be attributed to the linear strengthening in the regime of small elastic lattice strains. This study provides an in-depth understanding of low-temperature nanostructural relaxation and its relation to strengthening. |
| format | Article |
| id | doaj-art-3ab16df338834ddcb715e8cd265fd21c |
| institution | Kabale University |
| issn | 2589-9651 |
| language | English |
| publishDate | 2024-12-01 |
| publisher | KeAi Communications Co., Ltd. |
| record_format | Article |
| series | Nano Materials Science |
| spelling | doaj-art-3ab16df338834ddcb715e8cd265fd21c2025-01-04T04:56:51ZengKeAi Communications Co., Ltd.Nano Materials Science2589-96512024-12-0166726734The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealingZe Chai0Bo Peng1Xukai Ren2Kaiyuan Hong3Xiaoqi Chen4Shanghai Key Laboratory of Materials Laser Processing and Modification, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China; Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, 201800, China; Corresponding author. Shanghai Key Laboratory of Materials Laser Processing and Modification, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China.:Shanghai Key Laboratory of Materials Laser Processing and Modification, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, ChinaShaoxing Special Equipment Testing Institute, Shaoxing, 312071, ChinaShanghai Key Laboratory of Materials Laser Processing and Modification, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, ChinaShanghai Key Laboratory of Materials Laser Processing and Modification, School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China; Shien-Ming Wu School of Intelligent Engineering, South China University of Technology, 511442, ChinaThe microstructural evolution and relaxation strengthening of nano-grained Ni annealed at a temperature range of 493–553 K were studied by in situ X-ray diffraction technique, transmission electron microscopy, and microhardness evaluation. Upon low-temperature annealing, the rather limited variations of anisotropic grain size and root-mean-square strain, conforming to an exponential relaxation model, yield a consistent activation energy of approximately 0.5 eV, which corresponds to the localized, rapid diffusion of excess vacancies on nonequilibrium surfaces/interfaces and/or defective lattice configurations. Microstructure examinations confirm the grain boundary ordering and excess defect reduction. The relaxation-induced strength enhancement can be attributed to the linear strengthening in the regime of small elastic lattice strains. This study provides an in-depth understanding of low-temperature nanostructural relaxation and its relation to strengthening.http://www.sciencedirect.com/science/article/pii/S2589965123000934Nano-grained metalMicrostructureRelaxationMicrohardnessX-ray diffraction |
| spellingShingle | Ze Chai Bo Peng Xukai Ren Kaiyuan Hong Xiaoqi Chen The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing Nano Materials Science Nano-grained metal Microstructure Relaxation Microhardness X-ray diffraction |
| title | The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing |
| title_full | The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing |
| title_fullStr | The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing |
| title_full_unstemmed | The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing |
| title_short | The microstructural evolution and relaxation strengthening for nano-grained Ni upon low-temperature annealing |
| title_sort | microstructural evolution and relaxation strengthening for nano grained ni upon low temperature annealing |
| topic | Nano-grained metal Microstructure Relaxation Microhardness X-ray diffraction |
| url | http://www.sciencedirect.com/science/article/pii/S2589965123000934 |
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