APA (7th ed.) Citation

Kim, K., Oh, S., Bae, K., & Oh, H. Prediction of Wafer Performance: Use of Functional Outlier Detection and Regression. IEEE.

Chicago Style (17th ed.) Citation

Kim, Kyusoon, Seunghee Oh, Kiwook Bae, and Hee-Seok Oh. Prediction of Wafer Performance: Use of Functional Outlier Detection and Regression. IEEE.

MLA (9th ed.) Citation

Kim, Kyusoon, et al. Prediction of Wafer Performance: Use of Functional Outlier Detection and Regression. IEEE.