Formal Specification Based Automatic Test Generation for Embedded Network Systems
Embedded systems have become increasingly connected and communicate with each other, forming large-scaled and complicated network systems. To make their design and testing more reliable and robust, this paper proposes a formal specification language called SENS and a SENS-based automatic test genera...
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| Main Authors: | Eun Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2014-01-01
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| Series: | Journal of Applied Mathematics |
| Online Access: | http://dx.doi.org/10.1155/2014/909762 |
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