Choi, E. H., Nishihara, H., Ando, T., Tang, N. V., Aoki, M., Yoshisaka, K., . . . Ohsaki, H. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Wiley.
Chicago Style (17th ed.) CitationChoi, Eun Hye, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, and Hitoshi Ohsaki. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Wiley.
MLA (9th ed.) CitationChoi, Eun Hye, et al. Formal Specification Based Automatic Test Generation for Embedded Network Systems. Wiley.
Warning: These citations may not always be 100% accurate.