A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing
Integrated circuits that pass testing still have quality differences, thus making grading necessary. Traditional grading methods rely on static testing and electrical measurements, which are challenging to achieve precise grading, time-consuming, and costly. A new grading method based on the failure...
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| Format: | Article |
| Language: | English |
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MDPI AG
2025-02-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/15/4/2009 |
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| author | Wenfa Zhan Yangxinzi Zhou Jiangyun Zheng Xueyuan Cai Qingping Zhang Xiaoqing Wen |
| author_facet | Wenfa Zhan Yangxinzi Zhou Jiangyun Zheng Xueyuan Cai Qingping Zhang Xiaoqing Wen |
| author_sort | Wenfa Zhan |
| collection | DOAJ |
| description | Integrated circuits that pass testing still have quality differences, thus making grading necessary. Traditional grading methods rely on static testing and electrical measurements, which are challenging to achieve precise grading, time-consuming, and costly. A new grading method based on the failure rate within a dynamically effective space is proposed. This method dynamically adjusts the evaluation space and uses an exponential decay function to calculate the influence weight of each neighboring chip on the evaluated chip, thereby computing the weighted failure rate of the evaluated chip and quantitatively grading the chips after wafer testing based on the scores. Experiments show that this method not only accurately captures quality differences and ensures grading accuracy but also significantly improves grading efficiency. |
| format | Article |
| id | doaj-art-3813a4aa95a44e159d4e26e0ae6d2002 |
| institution | DOAJ |
| issn | 2076-3417 |
| language | English |
| publishDate | 2025-02-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj-art-3813a4aa95a44e159d4e26e0ae6d20022025-08-20T02:44:33ZengMDPI AGApplied Sciences2076-34172025-02-01154200910.3390/app15042009A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After TestingWenfa Zhan0Yangxinzi Zhou1Jiangyun Zheng2Xueyuan Cai3Qingping Zhang4Xiaoqing Wen5School of Electronic Engineering & Intelligent Manufacturing, Anqing Normal University, Anqing 246133, ChinaSchool of Electronic Engineering & Intelligent Manufacturing, Anqing Normal University, Anqing 246133, ChinaSchool of Electronic Engineering & Intelligent Manufacturing, Anqing Normal University, Anqing 246133, ChinaSchool of Electronic Engineering & Intelligent Manufacturing, Anqing Normal University, Anqing 246133, ChinaSchool of Electronic Engineering & Intelligent Manufacturing, Anqing Normal University, Anqing 246133, ChinaGraduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology, Iizuka-shi 820-8502, JapanIntegrated circuits that pass testing still have quality differences, thus making grading necessary. Traditional grading methods rely on static testing and electrical measurements, which are challenging to achieve precise grading, time-consuming, and costly. A new grading method based on the failure rate within a dynamically effective space is proposed. This method dynamically adjusts the evaluation space and uses an exponential decay function to calculate the influence weight of each neighboring chip on the evaluated chip, thereby computing the weighted failure rate of the evaluated chip and quantitatively grading the chips after wafer testing based on the scores. Experiments show that this method not only accurately captures quality differences and ensures grading accuracy but also significantly improves grading efficiency.https://www.mdpi.com/2076-3417/15/4/2009chip gradingdynamic adjustmentexponential decay functioneffective in-spacesemiconductor testing |
| spellingShingle | Wenfa Zhan Yangxinzi Zhou Jiangyun Zheng Xueyuan Cai Qingping Zhang Xiaoqing Wen A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing Applied Sciences chip grading dynamic adjustment exponential decay function effective in-space semiconductor testing |
| title | A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing |
| title_full | A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing |
| title_fullStr | A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing |
| title_full_unstemmed | A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing |
| title_short | A Method for Grading Failure Rates Within the Dynamic Effective Space of Integrated Circuits After Testing |
| title_sort | method for grading failure rates within the dynamic effective space of integrated circuits after testing |
| topic | chip grading dynamic adjustment exponential decay function effective in-space semiconductor testing |
| url | https://www.mdpi.com/2076-3417/15/4/2009 |
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