Belous, A. I., & Prybylski, A. V. IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS. Educational institution «Belarusian State University of Informatics and Radioelectronics».
Chicago Style (17th ed.) CitationBelous, A. I., and A. V. Prybylski. IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS. Educational institution «Belarusian State University of Informatics and Radioelectronics».
MLA (9th ed.) CitationBelous, A. I., and A. V. Prybylski. IDENTIFICATION OF SENSITIVITY FACTORS OF IC OUTPUT PARAMETERS TO INTERNAL DEFECTS. Educational institution «Belarusian State University of Informatics and Radioelectronics».
Warning: These citations may not always be 100% accurate.