Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors
We utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA ori...
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IEEE
2025-01-01
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| Series: | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits |
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| Online Access: | https://ieeexplore.ieee.org/document/11072438/ |
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| author | Wei Zhang Jianze Wang Xuanyao Fong |
| author_facet | Wei Zhang Jianze Wang Xuanyao Fong |
| author_sort | Wei Zhang |
| collection | DOAJ |
| description | We utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA orientation fluctuations influence polarization behavior are studied to gain insights into variations in FE device performance and reliability. In addition, we used the Voronoi algorithm to simulate multigrain (MG) FE capacitors and assess the impact of PA orientation fluctuations on the device variability of polycrystalline FE capacitors. Our analysis shows that the PA orientation, which is a significant intrinsic factor, collectively contributes to device variability. We conclude that engineering the PA orientation helps to optimize FE device performance and reliability, which is crucial for the development of high-performance FE memory technologies. |
| format | Article |
| id | doaj-art-35229bae250f4b4d9fee7ae1ecd8baba |
| institution | Kabale University |
| issn | 2329-9231 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Journal on Exploratory Solid-State Computational Devices and Circuits |
| spelling | doaj-art-35229bae250f4b4d9fee7ae1ecd8baba2025-08-20T03:31:15ZengIEEEIEEE Journal on Exploratory Solid-State Computational Devices and Circuits2329-92312025-01-0111748010.1109/JXCDC.2025.358658911072438Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric CapacitorsWei Zhang0https://orcid.org/0009-0001-5331-3137Jianze Wang1https://orcid.org/0000-0002-6846-3322Xuanyao Fong2https://orcid.org/0000-0001-5939-7389Department of Electrical and Computer Engineering, National University of Singapore (NUS), Queenstown, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore (NUS), Queenstown, SingaporeDepartment of Electrical and Computer Engineering, National University of Singapore (NUS), Queenstown, SingaporeWe utilized phase-field simulations to investigate the effects of polar-axis (PA) orientation fluctuations on the extrinsic properties of single ferroelectric (FE) grains, focusing on the coercive electrical field (EC) and the remnant polarization (Pr). The underlying mechanisms through which PA orientation fluctuations influence polarization behavior are studied to gain insights into variations in FE device performance and reliability. In addition, we used the Voronoi algorithm to simulate multigrain (MG) FE capacitors and assess the impact of PA orientation fluctuations on the device variability of polycrystalline FE capacitors. Our analysis shows that the PA orientation, which is a significant intrinsic factor, collectively contributes to device variability. We conclude that engineering the PA orientation helps to optimize FE device performance and reliability, which is crucial for the development of high-performance FE memory technologies.https://ieeexplore.ieee.org/document/11072438/Coercive electrical field (EC)device variabilityferroelectric (FE)phase-field simulationspolar-axis (PA) orientationremnant polarization (Pr) |
| spellingShingle | Wei Zhang Jianze Wang Xuanyao Fong Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors IEEE Journal on Exploratory Solid-State Computational Devices and Circuits Coercive electrical field (EC) device variability ferroelectric (FE) phase-field simulations polar-axis (PA) orientation remnant polarization (Pr) |
| title | Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors |
| title_full | Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors |
| title_fullStr | Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors |
| title_full_unstemmed | Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors |
| title_short | Polar-Axis Orientation Fluctuations and the Impact on the Intrinsic Variability in Ferroelectric Capacitors |
| title_sort | polar axis orientation fluctuations and the impact on the intrinsic variability in ferroelectric capacitors |
| topic | Coercive electrical field (EC) device variability ferroelectric (FE) phase-field simulations polar-axis (PA) orientation remnant polarization (Pr) |
| url | https://ieeexplore.ieee.org/document/11072438/ |
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