The Influence of a Constant Magnetic Field on a Vertical Combined Magnetic Field in Magneto-Optical Imaging
The extension direction of welding defects is random and uncontrollable, while magneto-optical imaging detection has a good imaging effect on defects perpendicular to the magnetic field direction. At present, magneto-optical detection methods may fail to detect small weld defects parallel to the dir...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
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| Series: | Metals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2075-4701/15/4/340 |
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| Summary: | The extension direction of welding defects is random and uncontrollable, while magneto-optical imaging detection has a good imaging effect on defects perpendicular to the magnetic field direction. At present, magneto-optical detection methods may fail to detect small weld defects parallel to the direction of the magnetic field. To overcome this problem, a non-destructive testing method based on magneto-optical imaging under a vertical combined magnetic field (VCMF) is proposed. The paper first establishes a simulation model to compare and analyze the magnetic leakage characteristics of cross grooves under a constant magnetic field (CMF), an alternating magnetic field (AMF), a rotating magnetic field (RMF), a parallel combined magnetic field (PCMF), and VCMF excitation, proving that detection does not easily fail under VCMF. Secondly, by changing the size of the CMF in the VCMF simulation model, it was found that, as the CMF intensity increases, a new maximum value will appear on the side of the defect contour close to the sample area. This maximum value increases with the increase of the CMF intensity, which can lead to misjudgment of the defect contour, that is, false contours. Finally, magneto-optical imaging was used to verify the imaging effect of weld defects under VCMFs. The results indicate that more comprehensive defect information can be detected under VCMFs. When the maximum value of the excitation current of the AMF is at least 12 times the excitation current of the CMF, there will be no false contour defects. |
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| ISSN: | 2075-4701 |