Probabilistic phase labeling and lattice refinement for autonomous materials research

Probabilistic phase labeling and lattice refinement for autonomous materials research

Abstract X-ray diffraction (XRD) is a powerful method for determining a material’s crystal structure in high-throughput experimentation, and is widely being incorporated in artificially intelligent agents for autonomous scientific discovery. However, rapid, automated, and reliable analysis of XRD da...

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Bibliographic Details
Main Authors: Ming-Chiang Chang, Sebastian Ament, Maximilian Amsler, Duncan R. Sutherland, Lan Zhou, John M. Gregoire, Carla P. Gomes, R. Bruce van Dover, Michael O. Thompson
Format: Article
Language:English
Published: Nature Portfolio 2025-05-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-025-01627-0
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