Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells
A spatially resolved absolute electroluminescence (EL) imaging method was utilized to analyze the photovoltaic properties and resistive loss properties of a GaAs thin-film solar cell. The <italic>I–V</italic> relation was extrapolated from the absolute EL efficiency measuremen...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2017-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/7993017/ |
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