Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells
A spatially resolved absolute electroluminescence (EL) imaging method was utilized to analyze the photovoltaic properties and resistive loss properties of a GaAs thin-film solar cell. The <italic>I–V</italic> relation was extrapolated from the absolute EL efficiency measuremen...
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| Format: | Article |
| Language: | English |
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IEEE
2017-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/7993017/ |
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| author | XiaoBo Hu Tengfei Chen Juanjuan Xue Guoen Weng Shaoqiang Chen Hidefumi Akiyama Ziqiang Zhu |
| author_facet | XiaoBo Hu Tengfei Chen Juanjuan Xue Guoen Weng Shaoqiang Chen Hidefumi Akiyama Ziqiang Zhu |
| author_sort | XiaoBo Hu |
| collection | DOAJ |
| description | A spatially resolved absolute electroluminescence (EL) imaging method was utilized to analyze the photovoltaic properties and resistive loss properties of a GaAs thin-film solar cell. The <italic>I–V</italic> relation was extrapolated from the absolute EL efficiency measurements in conjunction with the external-quantum-efficiency (EQE) measurements; the EL extrapolated <italic>I–V</italic> relation has a merit over the conventional <italic>I–V</italic> relation measured with a solar simulator that it could eliminate the series resistance effect caused by external probe contact. Then, the mapping of the internal voltage of the solar cell and the sheet resistance of the window layer of the solar cell were obtained from the calibrated absolute EL imaging method. Finally, optic electroconversion losses of the solar cell including radiative loss, nonradiative loss, thermalization loss, transmission loss, and junction loss were quantified given by the EL and EQE measurements. |
| format | Article |
| id | doaj-art-343d2505be4b475a97fe38987f03ab91 |
| institution | DOAJ |
| issn | 1943-0655 |
| language | English |
| publishDate | 2017-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-343d2505be4b475a97fe38987f03ab912025-08-20T03:16:04ZengIEEEIEEE Photonics Journal1943-06552017-01-01951910.1109/JPHOT.2017.27318007993017Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar CellsXiaoBo Hu0Tengfei Chen1Juanjuan Xue2Guoen Weng3Shaoqiang Chen4Hidefumi Akiyama5Ziqiang Zhu6Department of Electronic Engineering, East China Normal University, Shanghai, ChinaDepartment of Electronic Engineering, East China Normal University, Shanghai, ChinaDepartment of Electronic Engineering, East China Normal University, Shanghai, ChinaDepartment of Electronic Engineering, East China Normal University, Shanghai, ChinaDepartment of Electronic Engineering, East China Normal University, Shanghai, ChinaInstitute for Solid State Physics, The University of Tokyo, Chiba, JapanEast China Normal University, Shanghai, ChinaA spatially resolved absolute electroluminescence (EL) imaging method was utilized to analyze the photovoltaic properties and resistive loss properties of a GaAs thin-film solar cell. The <italic>I–V</italic> relation was extrapolated from the absolute EL efficiency measurements in conjunction with the external-quantum-efficiency (EQE) measurements; the EL extrapolated <italic>I–V</italic> relation has a merit over the conventional <italic>I–V</italic> relation measured with a solar simulator that it could eliminate the series resistance effect caused by external probe contact. Then, the mapping of the internal voltage of the solar cell and the sheet resistance of the window layer of the solar cell were obtained from the calibrated absolute EL imaging method. Finally, optic electroconversion losses of the solar cell including radiative loss, nonradiative loss, thermalization loss, transmission loss, and junction loss were quantified given by the EL and EQE measurements.https://ieeexplore.ieee.org/document/7993017/Luminiescence and fluorescenceimaging systems. |
| spellingShingle | XiaoBo Hu Tengfei Chen Juanjuan Xue Guoen Weng Shaoqiang Chen Hidefumi Akiyama Ziqiang Zhu Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells IEEE Photonics Journal Luminiescence and fluorescence imaging systems. |
| title | Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells |
| title_full | Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells |
| title_fullStr | Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells |
| title_full_unstemmed | Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells |
| title_short | Absolute Electroluminescence Imaging Diagnosis of GaAs Thin-Film Solar Cells |
| title_sort | absolute electroluminescence imaging diagnosis of gaas thin film solar cells |
| topic | Luminiescence and fluorescence imaging systems. |
| url | https://ieeexplore.ieee.org/document/7993017/ |
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