High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology
Technologies relying on single optoelectronic nanoparticles require characterization of individual particle performance, often demanding destructive dispersal of particles from solution. A microfluidic chip with an ultrathin channel (8 μm) provides a platform for the sequential high‐speed single‐par...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Wiley-VCH
2025-07-01
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| Series: | Advanced Photonics Research |
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| Online Access: | https://doi.org/10.1002/adpr.202500050 |
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| author | Tharaka MDS Weeraddana Keisuke Minehisa Stephen A. Church Charles Smith Fumitaro Ishikawa Patrick Parkinson |
| author_facet | Tharaka MDS Weeraddana Keisuke Minehisa Stephen A. Church Charles Smith Fumitaro Ishikawa Patrick Parkinson |
| author_sort | Tharaka MDS Weeraddana |
| collection | DOAJ |
| description | Technologies relying on single optoelectronic nanoparticles require characterization of individual particle performance, often demanding destructive dispersal of particles from solution. A microfluidic chip with an ultrathin channel (8 μm) provides a platform for the sequential high‐speed single‐particle characterization of functional nanomaterials using correlative spectroscopy and imaging. This platform is shown to allow study of semiconductor nanowires with measurement rates of up to 240 nanowires/minute in continuous operation, enabling a dramatically improved and statistically robust comparison of intrawire disorder with interwire homogeneity. An analysis of over 15 k GaAs/AlGaAs nanowires reveals that ensemble measurements overestimate the full‐width at half‐maximum of emission by more than 4× and statistical dispersion of electronic disorder by 28%, demonstrating the importance of single‐particle studies. |
| format | Article |
| id | doaj-art-3276a03c24aa4bde9dc8ade3f29c4960 |
| institution | Kabale University |
| issn | 2699-9293 |
| language | English |
| publishDate | 2025-07-01 |
| publisher | Wiley-VCH |
| record_format | Article |
| series | Advanced Photonics Research |
| spelling | doaj-art-3276a03c24aa4bde9dc8ade3f29c49602025-08-20T03:28:59ZengWiley-VCHAdvanced Photonics Research2699-92932025-07-0167n/an/a10.1002/adpr.202500050High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic TechnologyTharaka MDS Weeraddana0Keisuke Minehisa1Stephen A. Church2Charles Smith3Fumitaro Ishikawa4Patrick Parkinson5Department of Physics and Astronomy and the Photon Science Institute University of Manchester Manchester M13 9PL UKResearch Center for Integrated Quantum Electronics Hokkaido University Sapporo 060‐0813 JapanDepartment of Physics and Astronomy and the Photon Science Institute University of Manchester Manchester M13 9PL UKPhoton Science Institute University of Manchester Manchester M13 9PL UKResearch Center for Integrated Quantum Electronics Hokkaido University Sapporo 060‐0813 JapanDepartment of Physics and Astronomy and the Photon Science Institute University of Manchester Manchester M13 9PL UKTechnologies relying on single optoelectronic nanoparticles require characterization of individual particle performance, often demanding destructive dispersal of particles from solution. A microfluidic chip with an ultrathin channel (8 μm) provides a platform for the sequential high‐speed single‐particle characterization of functional nanomaterials using correlative spectroscopy and imaging. This platform is shown to allow study of semiconductor nanowires with measurement rates of up to 240 nanowires/minute in continuous operation, enabling a dramatically improved and statistically robust comparison of intrawire disorder with interwire homogeneity. An analysis of over 15 k GaAs/AlGaAs nanowires reveals that ensemble measurements overestimate the full‐width at half‐maximum of emission by more than 4× and statistical dispersion of electronic disorder by 28%, demonstrating the importance of single‐particle studies.https://doi.org/10.1002/adpr.202500050high throughputmicrofluidicsnanowiressemiconductorspectroscopy |
| spellingShingle | Tharaka MDS Weeraddana Keisuke Minehisa Stephen A. Church Charles Smith Fumitaro Ishikawa Patrick Parkinson High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology Advanced Photonics Research high throughput microfluidics nanowires semiconductor spectroscopy |
| title | High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology |
| title_full | High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology |
| title_fullStr | High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology |
| title_full_unstemmed | High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology |
| title_short | High‐Throughput Single‐Nanowire Optoelectronic Characterization Using Microfluidic Technology |
| title_sort | high throughput single nanowire optoelectronic characterization using microfluidic technology |
| topic | high throughput microfluidics nanowires semiconductor spectroscopy |
| url | https://doi.org/10.1002/adpr.202500050 |
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