APA (7th ed.) Citation

Doss, R., Ramakrishnan, J., Kavitha, S., Ramkumar, S., Latha, G. C. P., & Ramaswamy, K. Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers using a Deep Learning ShuffleNet-v2-CNN Model. Wiley.

Chicago Style (17th ed.) Citation

Doss, Rajesh, Jayabrabu Ramakrishnan, S. Kavitha, S. Ramkumar, G. Charlyn Pushpa Latha, and Kiran Ramaswamy. Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers Using a Deep Learning ShuffleNet-v2-CNN Model. Wiley.

MLA (9th ed.) Citation

Doss, Rajesh, et al. Classification of Silicon (Si) Wafer Material Defects in Semiconductor Choosers Using a Deep Learning ShuffleNet-v2-CNN Model. Wiley.