Kim, T., Lee, J., Gong, S., Lim, J., Kim, D., & Jeong, J. A Novel FS-GAN-Based Anomaly Detection Approach for Smart Manufacturing. MDPI AG.
Chicago Style (17th ed.) CitationKim, Tae-yong, Jieun Lee, Seokhyun Gong, Jaehoon Lim, Dowan Kim, and Jongpil Jeong. A Novel FS-GAN-Based Anomaly Detection Approach for Smart Manufacturing. MDPI AG.
MLA (9th ed.) CitationKim, Tae-yong, et al. A Novel FS-GAN-Based Anomaly Detection Approach for Smart Manufacturing. MDPI AG.
Warning: These citations may not always be 100% accurate.