Pilipenko, U. A., Kovalchuk, N. S., Shestovski, D. V., & Zhyhulin, D. V. Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface after Exposure with Long-Term and Rapid Thermal Annealing. Belarusian National Technical University.
Chicago Style (17th ed.) CitationPilipenko, U. A., N. S. Kovalchuk, D. V. Shestovski, and D. V. Zhyhulin. Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface After Exposure with Long-Term and Rapid Thermal Annealing. Belarusian National Technical University.
MLA (9th ed.) CitationPilipenko, U. A., et al. Energy-Dispersive X-Ray Microanalysis – as a Method for Study the Aluminium-Polysilicon Interface After Exposure with Long-Term and Rapid Thermal Annealing. Belarusian National Technical University.