Al-Mamun, N. S., Du, Y., Song, J., Chu, R., & Haque, A. Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing. MDPI AG.
Chicago Style (17th ed.) CitationAl-Mamun, Nahid Sultan, Yuxin Du, Jianan Song, Rongming Chu, and Aman Haque. Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing. MDPI AG.
MLA (9th ed.) CitationAl-Mamun, Nahid Sultan, et al. Electrothermal Failure Physics of GaN Schottky Diodes Under High-Temperature Forward Biasing. MDPI AG.
Warning: These citations may not always be 100% accurate.