Optical Detection and Cluster Analysis of Metal-Particle-Triggered Alternating Current Optical Partial Discharge in SF<sub>6</sub>
Accurately detecting defect-induced photon emissions enables early defect detection and characterization. To address this, a defect evolution state recognition model based on phase-resolved photon counting and dimensionality reduction calculations is proposed under alternating current (AC) excitatio...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
|
| Series: | Energies |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1996-1073/18/7/1649 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|