Complex Permittivity Measurements of Film-Type Materials: Effect of the Waveguide Flange
The flexibility and thinness of most film-type materials make it difficult to use conventional measurement methods such as those in international or organizational standards to accurately measure the complex permittivity of these materials. This led us to develop a novel approach—based on...
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| Main Authors: | Han-Hee Lee, Sang Wook Yoon, Jae Wook Lee |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10884763/ |
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