Tang, X., & Dong, K. Characteristics and Breakdown Behaviors of Polysilicon Resistors for High Voltage Applications. Wiley.
Chicago Style (17th ed.) CitationTang, Xiao-Yu, and Ke Dong. Characteristics and Breakdown Behaviors of Polysilicon Resistors for High Voltage Applications. Wiley.
MLA (9th ed.) CitationTang, Xiao-Yu, and Ke Dong. Characteristics and Breakdown Behaviors of Polysilicon Resistors for High Voltage Applications. Wiley.
Warning: These citations may not always be 100% accurate.