Lin, X., Lei, F., Liang, X., Jiao, Y., Zhao, X., Li, Z., . . . Yu, J. Quantitative detection of trace nanoplastics (down to 50 nm) via surface-enhanced Raman scattering based on the multiplex-feature coffee ring. Institue of Optics and Electronics, Chinese Academy of Sciences.
Chicago Style (17th ed.) CitationLin, Xinao, Fengcai Lei, Xiu Liang, Yang Jiao, Xiaofei Zhao, Zhen Li, Chao Zhang, and Jing Yu. Quantitative Detection of Trace Nanoplastics (down to 50 Nm) via Surface-enhanced Raman Scattering Based on the Multiplex-feature Coffee Ring. Institue of Optics and Electronics, Chinese Academy of Sciences.
MLA (9th ed.) CitationLin, Xinao, et al. Quantitative Detection of Trace Nanoplastics (down to 50 Nm) via Surface-enhanced Raman Scattering Based on the Multiplex-feature Coffee Ring. Institue of Optics and Electronics, Chinese Academy of Sciences.