APA (7th ed.) Citation

Bao, M., Wang, Y., Yang, J., & Li, X. Research on Single-Event Effect Hardening Method of Transverse Split-Gate Trench Metal-Oxide-Semiconductor Field-Effect Transistors. MDPI AG.

Chicago Style (17th ed.) Citation

Bao, Mengtian, Ying Wang, Jianqun Yang, and Xingji Li. Research on Single-Event Effect Hardening Method of Transverse Split-Gate Trench Metal-Oxide-Semiconductor Field-Effect Transistors. MDPI AG.

MLA (9th ed.) Citation

Bao, Mengtian, et al. Research on Single-Event Effect Hardening Method of Transverse Split-Gate Trench Metal-Oxide-Semiconductor Field-Effect Transistors. MDPI AG.