Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors
CdZnTe-based detectors are highly valued because of their high spectral resolution, which is an essential feature for nuclear medical imaging. However, this resolution is compromised when there are substantial defects in the CdZnTe crystals. In this study, we present a learning-based approach to det...
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| Format: | Article |
| Language: | English |
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MDPI AG
2024-10-01
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| Series: | Crystals |
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| Online Access: | https://www.mdpi.com/2073-4352/14/11/935 |
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| author | Manuel Ballester Jaromir Kaspar Francesc Massanés Srutarshi Banerjee Alexander Hans Vija Aggelos K. Katsaggelos |
| author_facet | Manuel Ballester Jaromir Kaspar Francesc Massanés Srutarshi Banerjee Alexander Hans Vija Aggelos K. Katsaggelos |
| author_sort | Manuel Ballester |
| collection | DOAJ |
| description | CdZnTe-based detectors are highly valued because of their high spectral resolution, which is an essential feature for nuclear medical imaging. However, this resolution is compromised when there are substantial defects in the CdZnTe crystals. In this study, we present a learning-based approach to determine the spatially dependent bulk properties and defects in semiconductor detectors. This characterization allows us to mitigate and compensate for the undesired effects caused by crystal impurities. We tested our model with computer-generated noise-free input data, where it showed excellent accuracy, achieving an average RMSE of 0.43% between the predicted and the ground truth crystal properties. In addition, a sensitivity analysis was performed to determine the effect of noisy data on the accuracy of the model. |
| format | Article |
| id | doaj-art-2c486b78471a40428ef5830d5f8712e3 |
| institution | OA Journals |
| issn | 2073-4352 |
| language | English |
| publishDate | 2024-10-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Crystals |
| spelling | doaj-art-2c486b78471a40428ef5830d5f8712e32025-08-20T02:28:12ZengMDPI AGCrystals2073-43522024-10-01141193510.3390/cryst14110935Characterization of Crystal Properties and Defects in CdZnTe Radiation DetectorsManuel Ballester0Jaromir Kaspar1Francesc Massanés2Srutarshi Banerjee3Alexander Hans Vija4Aggelos K. Katsaggelos5Department of Computer Sciences, Northwestern University, Evanston, IL 60208, USASiemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USASiemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USAX-ray Science Division, Argonne National Laboratory, Lemont, IL 60439, USASiemens Medical Solutions USA Inc., Hoffman Estates, Chicago, IL 60192, USADepartment of Computer Sciences, Northwestern University, Evanston, IL 60208, USACdZnTe-based detectors are highly valued because of their high spectral resolution, which is an essential feature for nuclear medical imaging. However, this resolution is compromised when there are substantial defects in the CdZnTe crystals. In this study, we present a learning-based approach to determine the spatially dependent bulk properties and defects in semiconductor detectors. This characterization allows us to mitigate and compensate for the undesired effects caused by crystal impurities. We tested our model with computer-generated noise-free input data, where it showed excellent accuracy, achieving an average RMSE of 0.43% between the predicted and the ground truth crystal properties. In addition, a sensitivity analysis was performed to determine the effect of noisy data on the accuracy of the model.https://www.mdpi.com/2073-4352/14/11/935CdZnTe crystalslearning-based characterizationphoton-counting detector simulation |
| spellingShingle | Manuel Ballester Jaromir Kaspar Francesc Massanés Srutarshi Banerjee Alexander Hans Vija Aggelos K. Katsaggelos Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors Crystals CdZnTe crystals learning-based characterization photon-counting detector simulation |
| title | Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors |
| title_full | Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors |
| title_fullStr | Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors |
| title_full_unstemmed | Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors |
| title_short | Characterization of Crystal Properties and Defects in CdZnTe Radiation Detectors |
| title_sort | characterization of crystal properties and defects in cdznte radiation detectors |
| topic | CdZnTe crystals learning-based characterization photon-counting detector simulation |
| url | https://www.mdpi.com/2073-4352/14/11/935 |
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