Effective preparation of low-melting solder materials for atom probe tomography

Effective preparation of low-melting solder materials for atom probe tomography

Abstract Low-melting metal alloys have gained renewed attention for additive manufacturing, energy storage and microelectronics. However, micro- and nanostructure characterisation demands highly sophisticated sample preparation. Here, we optimise the Ga-FIB preparation of atom probe tomography (APT)...

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Bibliographic Details
Main Authors: Charlotte Cui, Michael Tkadletz, Michael Reisinger, Peter Imrich, Walter Hartner, Roland Brunner
Format: Article
Language:English
Published: Nature Portfolio 2024-11-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-024-79753-w
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