A lightweight transformer with linear self‐attention for defect recognition
Abstract Visual defect recognition techniques based on deep learning models are crucial for modern industrial quality inspection. The backbone, serving as the primary feature extraction component of the defect recognition model, has not been thoroughly exploited. High‐performance vision transformer...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2024-09-01
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| Series: | Electronics Letters |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/ell2.13292 |
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