Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique

Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique

This paper proposes an integrated framework for reliability assessment, load growth evaluation, and optimal reconfiguration of islanded microgrids under increasing electricity demand. The studied microgrid consists of solar photovoltaic (PV) panels, wind turbines, and diesel generators, operating in...

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Bibliographic Details
Main Authors: Hieu M. Pham, Duy C. Huynh, Loc D. Ho, Matthew W. Dunnigan, Corina Barbalata
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Fick’s law optimization algorithm
long short-term memory technique
load forecasting
microgrid reconfiguration
reliability assessment
Online Access:https://ieeexplore.ieee.org/document/11114944/
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