APA (7th ed.) Citation

Pham, H. M., Huynh, D. C., Ho, L. D., Dunnigan, M. W., & Barbalata, C. Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique. IEEE.

Chicago Style (17th ed.) Citation

Pham, Hieu M., Duy C. Huynh, Loc D. Ho, Matthew W. Dunnigan, and Corina Barbalata. Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique. IEEE.

MLA (9th ed.) Citation

Pham, Hieu M., et al. Integrated Reliability Assessment and Optimal Reconfiguration of Islanded Microgrids Under Load Growth Using Fick’s Law Optimization Algorithm and Long Short-Term Memory Technique. IEEE.