Modeling Spectral LED Degradation Using an Unsupervised Machine Learning Approach

Modeling Spectral LED Degradation Using an Unsupervised Machine Learning Approach

The modeling of spectral characteristics of light-emitting diodes (LED) has been addressed in various studies. We extend the current state of knowledge by modeling the spectral characteristics of commercially available high-power LEDs, exhibiting a temperature-dependent degradation, by using a diffe...

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Bibliographic Details
Main Authors: Alexander Herzog, Benoit Hamon, Paul Myland, Peter Foerster, Simon Benkner, Babak Zandi, Victor Guerra, Sebastian Schoeps, Willem D. van Driel, Tran Quoc Khanh
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Light-emitting-diodes (LED)
power distribution
non-negative matrix factorization
spectral modeling
LED reliability
digital twin
Online Access:https://ieeexplore.ieee.org/document/11096560/
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