The influence of an impulsed ion radiation on the sensitivity parameters of integrated circuits to single event effects

The influence of an impulsed ion radiation on the sensitivity parameters of integrated circuits to single event effects

The paper analyzes the features of the experimental evaluation of the cross sections of single event effects (SEE) under the influence of pulsed ion beams. The main reasons that can distort the results of the experiment are multiple ion exposures to the same sensitive area, several single event effe...

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Bibliographic Details
Main Authors: Alexander I. Chumakov, Dmitry V. Bobrovsky, Sergey A. Soloviev
Format: Article
Language:English
Published: Joint Stock Company "Experimental Scientific and Production Association SPELS 2024-11-01
Series:Безопасность информационных технологий
Subjects:
security of information systems, pulsed ion beams, single event effects, nica nuclotron.
Online Access:https://bit.spels.ru/index.php/bit/article/view/1722
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