Chumakov, A. I., Bobrovsky, D. V., & Soloviev, S. A. The influence of an impulsed ion radiation on the sensitivity parameters of integrated circuits to single event effects. Joint Stock Company "Experimental Scientific and Production Association SPELS.
Chicago Style (17th ed.) CitationChumakov, Alexander I., Dmitry V. Bobrovsky, and Sergey A. Soloviev. The Influence of an Impulsed Ion Radiation on the Sensitivity Parameters of Integrated Circuits to Single Event Effects. Joint Stock Company "Experimental Scientific and Production Association SPELS.
MLA (9th ed.) CitationChumakov, Alexander I., et al. The Influence of an Impulsed Ion Radiation on the Sensitivity Parameters of Integrated Circuits to Single Event Effects. Joint Stock Company "Experimental Scientific and Production Association SPELS.