Mo, J., Zhao, X., & Zhou, M. Total Ionizing Dose Effects of Si Vertical Diffused MOSFET with SiO2 and Si3N4/SiO2 Gate Dielectrics. Wiley.
Chicago Style (17th ed.) CitationMo, Jiongjiong, Xuran Zhao, and Min Zhou. Total Ionizing Dose Effects of Si Vertical Diffused MOSFET with SiO2 and Si3N4/SiO2 Gate Dielectrics. Wiley.
MLA (9th ed.) CitationMo, Jiongjiong, et al. Total Ionizing Dose Effects of Si Vertical Diffused MOSFET with SiO2 and Si3N4/SiO2 Gate Dielectrics. Wiley.
Warning: These citations may not always be 100% accurate.