Spontaneous Cooling Enables High‐Quality Perovskite Wafers for High‐Sensitivity X‐Ray Detectors with a Low‐Detection Limit

Spontaneous Cooling Enables High‐Quality Perovskite Wafers for High‐Sensitivity X‐Ray Detectors with a Low‐Detection Limit

Abstract Developing high‐quality perovskite wafers is essential for integrating perovskite technology throughout the chip industry chain. In this article, a spontaneous cooling strategy with a hot‐pressing technique is presented to develop high‐purity, wafer‐scale, pinhole‐free perovskite wafers wit...

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Bibliographic Details
Main Authors: Wenyi Wu, Jianqiang Zhang, Ciyu Liu, Jiankai Zhang, Hoajie Lai, Zhongqiang Hu, Hai Zhou
Format: Article
Language:English
Published: Wiley 2024-12-01
Series:Advanced Science
Subjects:
perovskite wafers
spontaneous cooling strategy
X‐ray detection
Online Access:https://doi.org/10.1002/advs.202410303
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