Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

Diffractometer for element-specific analysis on local structures using a combination of X-ray fluorescence holography and anomalous X-ray scattering

To tackle disorder in crystals and short- and intermediate-range order in amorphous materials, such as glass, we developed a carry-in diffractometer to utilise X-ray fluorescence holography (XFH) and anomalous X-ray scattering (AXS), facilitating element-specific analyses with atomic resolution usin...

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Bibliographic Details
Main Authors: Hiroo Tajiri, Shinji Kohara, Koji Kimura, Sekhar Halubai, Haruto Morimoto, Naohisa Happo, Jens R. Stellhorn, Yohei Onodera, Xvsheng Qiao, Daisuke Urushihara, Peidong Hu, Toru Wakihara, Toyohiko Kinoshita, Koichi Hayashi
Format: Article
Language:English
Published: International Union of Crystallography 2025-01-01
Series:Journal of Synchrotron Radiation
Subjects:
x-ray diffractometers
x-ray fluorescence holography
anomalous x-ray scattering
element-specific measurements
carry-in equipment
Online Access:https://journals.iucr.org/paper?S1600577524011366
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